San Francisco, CA, United States of America

Ioana Cristina Munteanu

This inventor holds 1 USPTO granted patent. Top assignee: Sigma Computing, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ioana Cristina Munteanu. Retrieved from https://idiyas.com/inventor/ioana-cristina-munteanu

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ioana Cristina Munteanu: Patent Inventor at Sigma Computing

Introduction

Ioana Cristina Munteanu is an inventor based in San Francisco, California. Her work includes a patent related to generating network addresses for embedded workbooks that present data from a cloud-based data warehouse. She is associated with Sigma Computing, Inc.

Latest Patents

Munteanu is named on one patent: “Third-party addresses for embedded workbooks.” The invention describes how a workbook manager can receive a request for the network address of a third-party domain containing an embedded workbook. The manager retrieves identifiers for the workbook, its embedding element, and the third-party domain, then uses them to generate and present the address. The patent record provided lists 1 patent for Munteanu.

Career Highlights

Munteanu’s listed patent reflects work on connecting embedded workbooks with third-party domains and cloud-based data warehouse content. The supplied information associates her with Sigma Computing, Inc., but does not provide further details about her role or career history.

Collaborations

The supplied information names Zalak H. Trivedi and Samuel Andre Abraham Soubeyran as Munteanu’s coworkers. It does not specify whether they collaborated with her on the patent.

Conclusion

Ioana Cristina Munteanu’s listed invention addresses the generation of network addresses for embedded workbooks, linking her patent record to data presentation and cloud-based analytics.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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