Suwon, South Korea

Injoo Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Injoo Lee. Retrieved from https://idiyas.com/inventor/injoo-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Injoo Lee and a Smarter Clothes-Drying Control Method.

Introduction

Injoo Lee is an inventor based in Suwon, South Korea, and works at Samsung Electronics Ltd. His patent work includes a clothes-dryer control method designed to adapt drying to the characteristics and moisture level of a load.

Latest Patents

Lee is associated with 1 patent: “Clothes Dryer and Method for Controlling the Same.” The invention describes a dryer with a drum, a weight-detection sensor, a moisture-content sensor, and a controller. After an initial drying period, the controller uses the load’s weight and residual moisture information to assign the items to a category. It then monitors moisture reduction against category-specific reference times and thresholds, determines the appropriate drying level, and starts a main drying cycle using the corresponding control conditions.

Career Highlights

Lee’s listed patent focuses on responsive drying control. By considering both load weight and moisture reduction, the method aims to tailor the main drying cycle to the detected load category and drying level.

Collaborations

The provided information identifies Gawon Lee and Sangoh Yoo as Lee’s coworkers. It does not specify whether they collaborated with him on this patent.

Conclusion

Injoo Lee’s patent describes a sensor-guided approach to clothes drying that adjusts the main cycle according to load characteristics and measured moisture reduction.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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