Donghae, South Korea

Inhye Hahm

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Korea Atomic Energy Research Institute. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Inhye Hahm. Retrieved from https://idiyas.com/inventor/inhye-hahm

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: Inhye Hahm: Innovator in Nuclear Safety

Introduction

Inhye Hahm is a notable inventor based in Donghae-si, South Korea. He has made significant contributions to the field of nuclear safety through his innovative methods. His work focuses on improving the safety and efficiency of nuclear power plants.

Latest Patents

Inhye Hahm holds a patent for a method of removing radioactive structures from walls in nuclear power plants. This patent, which is crucial for maintaining safety in nuclear facilities, outlines a process that includes flattening uneven surfaces of a wall, drilling to extract radioactive materials, and safely storing the extracted materials in a shielding container. He has 1 patent to his name.

Career Highlights

Hahm is affiliated with the Korea Atomic Energy Research Institute, where he applies his expertise in nuclear technology. His work is essential in ensuring the safety and reliability of nuclear energy production.

Collaborations

Inhye Hahm has collaborated with notable colleagues such as Kwanseong Jeong and Seung-Kook Park. Their combined efforts contribute to advancements in nuclear safety and technology.

Conclusion

Inhye Hahm's innovative approach to nuclear safety exemplifies the importance of research and development in the energy sector. His contributions are vital for the future of safe nuclear energy.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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