Plauen, Germany

Ingo Schenk

This inventor holds 2 USPTO granted patents. Top assignee: Sypro Optics Gmbh. Active years: 2015-2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ingo Schenk. Retrieved from https://idiyas.com/inventor/ingo-schenk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 2

Forward Citations = 4(Granted Patents)


Location History:

  • Plauen, DE (US) (2015)
  • Plauen, DE (2016)

Company Filing History:


Years Active: 2015-2016

Loading Chart...
2 patents (USPTO):Explore Patents

Title: Ingo Schenk: Innovator in Optical Technology

Introduction

Ingo Schenk is a notable inventor based in Plauen, Germany. He has made significant contributions to the field of optical technology, particularly in the development of devices that enhance the capture of three-dimensional objects. With a total of 2 patents to his name, Schenk's work exemplifies innovation and practicality in design.

Latest Patents

Schenk's latest patents include a device for generating an optical dot pattern. This device is designed to capture three-dimensional objects effectively. It allows for a sufficiently large number of projected pixels while maintaining high image quality. Additionally, it boasts a compact size and low assembly costs, making it a valuable asset in optical technology.

Career Highlights

Ingo Schenk is currently associated with Sypro Optics GmbH, where he continues to push the boundaries of optical innovation. His work at the company has been instrumental in developing advanced optical solutions that cater to various industries.

Conclusion

Ingo Schenk's contributions to optical technology through his patents and work at Sypro Optics GmbH highlight his role as a key innovator in the field. His inventions not only improve image quality but also enhance the efficiency of capturing three-dimensional objects.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…