Indradeep Ghosh

Title: Indradeep Ghosh: Innovator in Integrated Circuit Testing

Introduction

Indradeep Ghosh is a notable inventor based in Sunnyvale, CA. He has made significant contributions to the field of integrated circuits, particularly in testing methodologies. His innovative approach has led to the development of a unique patent that enhances the testing process for controller-data path circuits.

Latest Patents

Indradeep Ghosh holds a patent titled "Method for implementing a BIST scheme into integrated circuits for testing RTL controller-data paths in the integrated circuits." This method allows for testing a controller-data path RTL circuit using a Built-In Self-Test (BIST) scheme without imposing major design restrictions on the circuit. The process involves extracting a state table from the controller netlist of the circuit using a state machine extraction program. The untested RTL elements in the circuit are selected, and the test control and data flow (TCDF) are extracted. A symbolic testability analysis is then performed to obtain test environments for untested data path elements. The controller input sequence needed for the test environment is noted and stored, leading to the synthesis of a BIST controller integrated with the circuit.

Career Highlights

Indradeep Ghosh has had a successful career at Agere Systems Guardian Corporation, where he has applied his expertise in integrated circuit design and testing. His work has been instrumental in advancing the reliability and efficiency of electronic systems.

Collaborations

Indradeep has collaborated with notable colleagues such as Niraj K Jha and Sudipta Bhawmik. Their combined efforts have contributed to the development of innovative solutions in the field of integrated circuits.

Conclusion

Indradeep Ghosh's contributions to integrated circuit testing through his patented methods demonstrate his commitment to innovation in technology. His work continues to influence the industry and improve testing methodologies for electronic systems.