Yongin, South Korea

In Dong Kim

This inventor holds 1 USPTO granted patent and 6 published patent applications. Top assignee: Vieworks Co., Ltd.. Active years: 2024.

IDiyas Innovation Intelligence. (2026). Inventor Profile: In Dong Kim. Retrieved from https://idiyas.com/inventor/in-dong-kim-c5db7rg7

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1


Company Filing History:


Years Active: 2024

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1 patent (USPTO):Explore Patents

Title: In Dong Kim: Innovator in Imaging Technology

Introduction

In Dong Kim is a notable inventor based in Yongin, South Korea. He has made significant contributions to the field of imaging technology, particularly through his innovative patent that enhances the accuracy of image capturing systems.

Latest Patents

In Dong Kim holds a patent for a "Multi-panel detector and imaging system including the same." This invention provides a multi-panel detector that includes a marker to accurately match images photographed on a plurality of panels. The detector features a panel unit comprising a first panel and a second panel, which are partially overlapping at the rear portion of the first panel. Additionally, it includes at least one marker positioned between the front portions of the first and second panels, along with a radiation transmitting part formed at the end of the first panel.

Career Highlights

In Dong Kim is associated with Vieworks Co., Ltd., a company known for its advancements in imaging technology. His work has contributed to the development of systems that improve the precision and efficiency of image capturing.

Collaborations

In his professional journey, In Dong Kim collaborates with Su Hyeon An, further enhancing the innovative capabilities within his field.

Conclusion

In Dong Kim's contributions to imaging technology through his patent demonstrate his commitment to innovation and excellence. His work continues to influence the industry and pave the way for future advancements.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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