Suwon, South Korea

Ilkwon Kim

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ilkwon Kim. Retrieved from https://idiyas.com/inventor/ilkwon-kim-6j1z23qd

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Ilkwon Kim - Innovator in Neural Network Technology.

Introduction

Ilkwon Kim is an inventor based in Suwon-si, South Korea. He is known for his work in the field of neural networks, particularly focusing on devices and systems that enhance image processing capabilities. His innovative approach aims to improve the efficiency and accuracy of image analysis through advanced neural network techniques.

Latest Patent Applications

Ilkwon Kim has submitted a patent application titled "NEURAL NETWORK DEVICE AND SYSTEM AND OPERATING METHOD OF THE NEURAL NETWORK DEVICE." This application describes a neural network device that includes a pre-processor for selecting target images from scanning electron microscope (SEM) images. The pre-processor is designed to crop these images into multiple cropped images based on their respective frequencies. Furthermore, a neural network processor is utilized to generate a crop detection image by inferring target objects from the cropped images using a trained segmentation model. Finally, a post-processor merges the crop detection images into a size that matches the original SEM images, based on the position information of the cropped images.

Conclusion

Ilkwon Kim's contributions to neural network technology demonstrate his commitment to advancing image processing methods. His innovative patent application reflects the potential for significant improvements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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