This inventor holds 4 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignees: Meshworks Wireless Oy, Patria Advanced Solutions Oy. Active years: 2004-2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2004-2025
Title: Ilkka Reis: Innovator in Climate Measurement Technology
Introduction
Ilkka Reis is a notable inventor based in Tampere, Finland. He has made significant contributions to the field of climate measurement technology, holding a total of 4 patents. His innovative approach has led to advancements that enhance our understanding of environmental conditions within structures.
Latest Patents
One of Ilkka Reis's latest patents focuses on measuring climate inside a longitudinal cavity of a structure. This invention allows for climate measurement from two or more positions within the cavity, which can have open or closed ends. The arrangement consists of interconnectable sections, including at least one sensor section and one or more extension sections. The sensor section is designed to measure various quantities indicating the climate, while the extension sections facilitate positioning the sensor from the cavity's ends to a specific measurement location.
Career Highlights
Throughout his career, Ilkka Reis has worked with several companies, including Patria Advanced Solutions Oy and Meshworks Wireless Oy. His experience in these organizations has contributed to his expertise in developing innovative solutions for climate measurement.
Collaborations
Ilkka has collaborated with notable professionals in his field, including Mikko Simonen and Marko Kyrölä. These partnerships have further enriched his work and led to the development of impactful technologies.
Conclusion
Ilkka Reis stands out as an inventor dedicated to advancing climate measurement technology. His innovative patents and collaborative efforts reflect his commitment to improving our understanding of environmental conditions within structures.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile