Suwon-si, South Korea

Iljun Ahn

This inventor holds 4 USPTO granted patents and 2 published patent applications and 3 EPO patents. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

USPTO Granted Patents = 4 

% Patents Active = 75.0


Average Co-Inventor Count = 5.7

ph-index = 1


Company Filing History:


Years Active: 2026

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4 patents (USPTO):Explore Patents

Title: Iljun Ahn: Innovator in Image Processing Technology

Introduction

Iljun Ahn is a prominent inventor based in Suwon-si, South Korea. He has made significant contributions to the field of image processing, particularly through his innovative patent that enhances the efficiency of image analysis using neural networks. His work is instrumental in advancing technology in this area.

Latest Patents

Iljun Ahn holds a patent for an "Image processing apparatus and operating method thereof." This invention involves an image processing apparatus that utilizes a single neural network to process images. The apparatus includes a memory for storing instructions and a processor that executes these instructions to obtain feature data from images. The method enhances image processing by obtaining various feature data and generating a refined image based on this data.

Career Highlights

Iljun Ahn is currently employed at Samsung Electronics Ltd., a leading global technology company. His role at Samsung allows him to work on cutting-edge technologies and contribute to innovative projects that shape the future of electronics and imaging.

Collaborations

Iljun Ahn collaborates with talented colleagues, including Soomin Kang and Youngchan Song. Their teamwork fosters a creative environment that drives innovation and leads to the development of advanced technologies in image processing.

Conclusion

Iljun Ahn's contributions to image processing technology through his patent and work at Samsung Electronics Ltd. highlight his role as a key innovator in the field. His efforts continue to influence advancements in image analysis and processing.

Profile summary based on public USPTO records.
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