Gimcheon, South Korea

Il Su So

This inventor holds 1 USPTO granted patent. Top assignee: Kepco Engineering & Construction Company, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Il Su So. Retrieved from https://idiyas.com/inventor/il-su-so

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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Average Co-Inventor Count = 1.0

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Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Il Su So and His Patent for Measuring Fluid Temperature

Introduction

Il Su So is an inventor associated with Gimcheon, South Korea, and Kepco Engineering & Construction Company, Inc. His work includes a patented system for estimating the temperature of fluid flowing inside a pipe.

Latest Patents

The patent listed for Il Su So is titled “System for Calculating Temperature of Fluid Inside Pipe by Using Heat Flux, Outer Surface Temperature of Pipe, and Flow Velocity of Fluid.” It describes a system that combines measurements from a flow meter, a heat flux meter, and a thermometer. A calculator uses the fluid’s flow velocity, the heat flux passing through the pipe’s outer surface, and the pipe’s outer surface temperature to calculate the fluid’s internal temperature. The supplied information lists 1 patent for So.

Career Highlights

So is associated with Kepco Engineering & Construction Company, Inc. His patented system brings together flow, heat-flux, and surface-temperature measurements to determine a fluid temperature that is not measured directly inside the pipe.

Collaborations

The supplied information identifies Kyeong Mo Hwang and Gye Chul Cho as So’s coworkers. Their names are provided as professional associations, though no specific joint patent or collaboration details are included.

Conclusion

Il Su So’s listed patent presents a measurement-based approach to calculating fluid temperature inside a pipe, using data gathered from the fluid and the pipe’s outer surface.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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