Seoul, South Korea

Il Je Hyung

This inventor holds 1 USPTO granted patent. Top assignee: Hyosung Tns Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Il Je Hyung. Retrieved from https://idiyas.com/inventor/il-je-hyung

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Il Je Hyung and ATM Maintenance Innovation.

Introduction

Il Je Hyung is an inventor based in Seoul, South Korea, associated with Hyosung TNS Inc. His patent work addresses how ATM failures can be diagnosed and how useful maintenance information can be delivered to technicians.

Latest Patents

The provided information lists one patent for Il Je Hyung: “Method for Diagnosing Failure of and Providing Maintenance Information About ATM.” The invention uses sensor readings collected during a failed transaction to identify the ATM node where an abnormal value first appeared. It then predicts the module that may have caused the abnormal operation and provides technicians with information about both the failure location and its likely cause. This approach is intended to help maintenance workers repair the failed module and address the module responsible for the underlying cause.

Career Highlights

Hyung’s listed patent reflects an emphasis on practical ATM diagnostics and maintenance support. By connecting sensor data with likely failure causes, the method aims to make troubleshooting more targeted and informative. The supplied data associates him with 1 patent.

Collaborations

The provided information names Kyung Il Ha and Keum Bo Na as Hyung’s coworkers. It does not specify their roles in the patent or describe the nature of their collaboration.

Conclusion

Il Je Hyung’s documented invention focuses on improving ATM fault diagnosis by helping technicians identify both where a failure occurred and what may have caused it.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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