Il-Hwan Nam

Title: Innovations by Il-Hwan Nam: Advancements in Measurement Technology

Introduction

Il-Hwan Nam is a notable inventor based in Hwaseong-si, South Korea. He has made significant contributions to the field of measurement technology, focusing on innovative methods to measure the thickness of objects. His expertise exemplifies the spirit of creativity and research driving advancements in technological applications.

Latest Patents

Il-Hwan Nam holds a patent for a method aimed at measuring the thickness of an object. This innovative method involves acquiring at least one wavelength domain spectrum for an amplitude ratio (Φ) and a phase difference (Θ) of reflected light from a film material. The process includes converting the wavelength domain spectrum into a 1/wavelength domain spectrum, followed by obtaining a resulting spectrum through fast Fourier transform (FFT) on the converted domain. Ultimately, this technique allows for accurate measurement of the film material's thickness based on the resulting spectrum.

Career Highlights

Il-Hwan Nam is currently employed at Samsung Electronics Co., Ltd., a leading global technology company known for its innovations in electronics and telecommunications. His role within the organization underscores his commitment to advancing technology through inventive solutions.

Collaborations

Throughout his career, Il-Hwan has collaborated with esteemed colleagues such as Jang-Ik Park and Kwan-Woo Ryu. These partnerships not only enhance his work but also contribute to the collective knowledge and innovation within the industry.

Conclusion

In summary, Il-Hwan Nam's contributions to measurement technology through his patent demonstrate the impact of innovation in the field. His work at Samsung Electronics Co., Ltd., along with his collaborations, reflects the importance of interdisciplinary effort in fostering advancements that lead to practical applications in technology.