Seoul, South Korea

Il-Hwan Lee

This inventor holds 2 USPTO granted patents and 1 published patent application. Top assignees: Snu Precision Co., Ltd., Other. Active years: 2006-2012.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Il-Hwan Lee. Retrieved from https://idiyas.com/inventor/il-hwan-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 2 

% Patents Active = 50.0

Average Co-Inventor Count = 3.4

ph-index = 2

Forward Citations = 25(Granted Patents)


Company Filing History:


Years Active: 2006-2012

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2 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Il-Hwan Lee

Introduction

Il-Hwan Lee is a notable inventor based in Seoul, South Korea, who has made significant contributions to the field of optical examination technology. With a total of two patents to his name, his inventions focus on advanced inspection mechanisms that enhance precision and efficiency.

Latest Patents

Lee's latest invention, the Dark-field Examination Device, introduces a groundbreaking method for examining objects under specific lighting conditions. This device is designed with an illumination unit that directs light towards the examination object on a base. It features a reflection unit that reflects the incident light back towards the examination object and an imaging unit that captures the scattered light, allowing for detailed imaging of the object. The innovative arrangement of these components allows for more effective examination of items, showcasing Lee's ingenuity in optical technology.

In addition to this, Lee has developed a Machine and Method for Inspecting Ferrules of Optical Connectors. This machine employs a fixture to arrange the ferrules in a rectangular system for inspection, where a robot centers the first ferrule on an optical system consisting of two cameras. These cameras capture inside and outside diameter image data, allowing for precise calculations of the ferrules' dimensions and eccentricities through a computer program. This invention significantly enhances the efficiency of the inspection process in optical technology.

Career Highlights

Lee's professional journey includes working with SNU Precision Co., Ltd., where he applied his expertise in optical systems to develop innovative solutions. His career reflects a commitment to advancing technology and improving inspection methods in the optical field.

Collaborations

Throughout his career, Il-Hwan Lee has collaborated with talented professionals such as Tai-Wook Kim and Heui-Jae Park. These partnerships have likely fostered a creative environment, encouraging the exchange of ideas that drive innovation.

Conclusion

Il-Hwan Lee stands out as a key figure in the field of optical technology. His inventive spirit, demonstrated through his patents and collaborations, continues to influence the industry. With a focus on developing advanced examination devices, Lee's contributions are essential to the growth and sophistication of optical inspections.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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