Chiba, Japan

Ikuo Yarita


Average Co-Inventor Count = 3.8

ph-index = 6

Forward Citations = 121(Granted Patents)


Company Filing History:


Years Active: 1987-2004

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16 patents (USPTO):Explore Patents

Title: Ikuo Yarita: Innovator in Ultrasonic Flaw Detection

Introduction

Ikuo Yarita is a prominent inventor based in Chiba, Japan. He has made significant contributions to the field of ultrasonic flaw detection, holding a total of 16 patents. His innovative methods and devices have advanced the detection of surface flaws in various materials.

Latest Patents

Yarita's latest patents include a method of displaying signals obtained by measuring probes and a device for ultrasonic flaw detection. The first patent focuses on displaying testing results of surface flaws, such as cracks, using colors within different color regions in the color space. This method allows for the effective visualization of small flaw signals, ensuring that they are not overlooked. The second patent describes an ultrasonic flaw detection method and instrument suitable for nonmetallic materials. It utilizes line focus type ultrasonic transmitter and receiver elements to detect flaws, optimizing the detection process.

Career Highlights

Ikuo Yarita has had a distinguished career at Kawasaki Steel Corporation, where he has applied his expertise in ultrasonic technology. His work has been instrumental in enhancing the reliability and accuracy of flaw detection methods in various industrial applications.

Collaborations

Yarita has collaborated with notable colleagues, including Kazuhito Kenmochi and Hajime Takada. These partnerships have contributed to the development of innovative solutions in the field of ultrasonic testing.

Conclusion

Ikuo Yarita's contributions to ultrasonic flaw detection have significantly impacted the industry. His patents reflect a commitment to innovation and excellence in technology.

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