The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 05, 2002
Filed:
Nov. 01, 2000
Kawasaki Steel Corporation, Kobe, JP;
Abstract
A method and apparatus for ultrasonic flaw detection of line focus type suitable for detection of flaws in nonmetallic materials included in an object. Ultrasonic transmitter and receiver elements of line focus type are opposed at a distance (L) with an object under test placed between them, and a maximum ultrasonic echo is obtained at a distance L expressed by: L =0.75(FT+FR)−{(CS/CW)−1}t where FT (mm) is the focal length in the medium of the ultrasonic transmitter element of line focus type, FR (mm) is the focal length in the medium of the ultrasonic receiver element line focus type, CS (m/sec) is the speed of ultrasound in an object under test, CW (m/sec) is the speed of ultrasound in the medium, and t (mm) is the thickness of the object under test.