Hiratsuka, Japan

Ikuo Uchino

This inventor holds 2 USPTO granted patents. Top assignee: Kabushiki Kaisha Komatsu Seisakusho. Active years: 1995-1997.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ikuo Uchino. Retrieved from https://idiyas.com/inventor/ikuo-uchino

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 2

Forward Citations = 55(Granted Patents)


Company Filing History:


Years Active: 1995-1997

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2 patents (USPTO):Explore Patents

Title: Ikuo Uchino: Innovator in Metal Detection Technology

Introduction

Ikuo Uchino is a notable inventor based in Hiratsuka, Japan. He has made significant contributions to the field of metal detection technology. With a total of 2 patents, Uchino has demonstrated his expertise and innovative spirit in this specialized area.

Latest Patents

Uchino's latest patents include a metal particle detecting sensor and a metal particle detecting method. Additionally, he has developed an electrode structure of a metallic particle detecting sensor. These inventions showcase his commitment to advancing technology in metal detection.

Career Highlights

Ikuo Uchino is currently employed at Kabushiki Kaisha Komatsu Seisakusho, where he continues to work on innovative projects. His role at the company allows him to apply his knowledge and skills in practical applications, contributing to the advancement of technology in his field.

Collaborations

Uchino has collaborated with notable coworkers, including Atsuhiko Hirosawa and Akira Mori. These partnerships have likely enriched his work and fostered a collaborative environment for innovation.

Conclusion

Ikuo Uchino is a distinguished inventor whose work in metal detection technology has led to valuable patents and advancements in the field. His contributions continue to influence the industry and inspire future innovations.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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