Yongin, South Korea

Ii Soon Lim

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ii Soon Lim. Retrieved from https://idiyas.com/inventor/ii-soon-lim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 1(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations of Ii Soon Lim

Introduction

Ii Soon Lim is a notable inventor based in Yongin, South Korea. He has made significant contributions to the field of image processing through his innovative patent. His work is particularly relevant in the context of modern digital imaging technologies.

Latest Patents

Ii Soon Lim holds a patent for an "Area-based encoding/decoding device and method," specifically a region-based encoding apparatus and decoding apparatus. This invention involves an encoding apparatus that selects an optimum region division mode from various modes concerning regions divided from an image frame. It transmits to the decoding apparatus an optimum image filtering method and an optimum filter coefficient of the divided regions, based on the selected region division mode. He has 1 patent to his name.

Career Highlights

Ii Soon Lim is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His role at Samsung allows him to work on cutting-edge technologies and contribute to advancements in image processing.

Collaborations

One of his notable coworkers is Ho Cheon Wey, with whom he collaborates on various projects within the company.

Conclusion

Ii Soon Lim's innovative work in image processing exemplifies the impact of technology on modern imaging solutions. His contributions continue to influence advancements in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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