Company Filing History:
Years Active: 2019
Title: Igor Alexandrovich Makhotkin: Innovator in X-ray Reflectivity
Introduction
Igor Alexandrovich Makhotkin is a notable inventor based in Almelo, Netherlands. He has made significant contributions to the field of thin film analysis through his innovative patent. His work focuses on enhancing the understanding of material compositions at a microscopic level.
Latest Patents
Makhotkin holds a patent for a method titled "Model independent grazing incidence X-ray reflectivity." This method measures the properties of a thin film stack by dividing the stack into sub-layers. Each sub-layer's composition is represented by a number P, where integers indicate pure materials and fractional values denote mixtures of adjacent pure materials. This representation is crucial for fitting measured data, allowing for a better understanding of the material composition as a function of depth.
Career Highlights
Igor Makhotkin is associated with Malvern Panalytical B.V., a company known for its advanced analytical instruments. His work there has been instrumental in developing techniques that improve the accuracy of thin film measurements. Makhotkin's expertise in X-ray reflectivity has positioned him as a key figure in his field.
Collaborations
Makhotkin has collaborated with notable professionals, including Sergey Yakunin. These collaborations have furthered research and development in the area of material science, enhancing the capabilities of the technologies they work on.
Conclusion
Igor Alexandrovich Makhotkin's contributions to the field of X-ray reflectivity demonstrate his innovative spirit and dedication to advancing material analysis techniques. His work continues to influence the industry and inspire future research.