Giv'atayim, Israel

Idan Einav

This inventor holds 1 USPTO granted patent and 1 EPO patent. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Idan Einav. Retrieved from https://idiyas.com/inventor/idan-einav

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0


Average Co-Inventor Count = 5.0

ph-index = 1


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Idan Einav: Radar Tracking and Target Identification

Introduction

Idan Einav is an inventor associated with Giv'atayim, Israel. His patent work includes systems that use networks of radar sensors to track targets across extended areas.

Latest Patents

The available information lists one patent for Einav: Systems and Methods for Using Multiple Radar Sensors to Track Targets Over Extended Ranges. The invention describes a network in which each radar sensor monitors part of an extended area, identifies detected targets, and shares metadata with neighboring sensors. This coordination is designed to maintain unique identification and continuous tracking as targets move between monitored areas. In retail settings, the system may also monitor customer behavior and generate a journey showing each identified customer’s path. Einav is credited with 1 patent.

Career Highlights

Einav is associated with Vayyar Imaging Ltd. His listed patent focuses on combining data from multiple radar sensors for extended-range tracking and applications such as retail customer-journey analysis.

Collaborations

The provided information names Tomer Zimmerman and Alexei Khazan as Einav’s coworkers. It does not specify their roles in the patent or whether they collaborated on it.

Conclusion

Idan Einav’s listed invention applies coordinated radar sensing to continuous target tracking, with potential uses that include monitoring customer journeys in retail environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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