Sayama, Japan

Ichirou Kouno

This inventor holds 1 USPTO granted patent. Top assignee: Honda Giken Kogyo Kabushiki Kaisha. Active years: 1998.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ichirou Kouno. Retrieved from https://idiyas.com/inventor/ichirou-kouno

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1

Forward Citations = 13(Granted Patents)


Company Filing History:


Years Active: 1998

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1 patent (USPTO):Explore Patents

Title: Ichirou Kouno: Innovator in Quality Control Data Processing

Introduction

Ichirou Kouno is a notable inventor based in Sayama, Japan. He has made significant contributions to the field of quality control data processing, particularly in manufacturing environments. His innovative approach has led to the development of a unique apparatus that enhances the efficiency of inspection processes.

Latest Patents

Ichirou Kouno holds a patent for an "Apparatus for processing quality control data." This invention allows operators to select preference settings on a CRT through a touch panel. The operating preference setting unit controls the CRT to display a menu for establishing settings for inspecting devices in production lines. This system enables operators to manage quality control data without requiring extensive programming knowledge.

Career Highlights

Kouno is associated with Honda Giken Kogyo Kabushiki Kaisha, a prominent company in the automotive industry. His work focuses on improving the quality control processes within manufacturing, ensuring that products meet high standards of excellence.

Collaborations

Ichirou Kouno has collaborated with notable coworkers such as Hiroshi Nagano and Keiji Takakura. Their combined expertise has contributed to advancements in quality control technologies.

Conclusion

Ichirou Kouno's innovative contributions to quality control data processing have made a significant impact in the manufacturing sector. His patent reflects a commitment to enhancing operational efficiency and ensuring product quality.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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