Kawaguchi, Japan

Ichikawa Hiroyuki

This inventor holds 1 USPTO granted patent. Top assignee: Enplas Corporation. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ichikawa Hiroyuki. Retrieved from https://idiyas.com/inventor/ichikawa-hiroyuki

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Ichikawa Hiroyuki: Innovator in Contact Probe Technology

Introduction

Ichikawa Hiroyuki is a notable inventor based in Kawaguchi, Japan. He has made significant contributions to the field of electrical testing through his innovative designs. His work focuses on enhancing the stability and efficiency of contact probes used in various applications.

Latest Patents

Ichikawa holds a patent for a contact probe that features a unique tubular structure. This design includes an engagement part, a pushing part, and an elastic member. The elastic member is strategically positioned within the tubular structure to ensure consistent bending in one direction. This innovation improves the stability of the structures within the contact probe, thereby enhancing the reliability of electrical testing.

Career Highlights

Ichikawa Hiroyuki is associated with Enplas Corporation, where he continues to develop cutting-edge technologies. His work has been instrumental in advancing the capabilities of contact probes, making them more effective for electrical testing purposes. With 1 patent to his name, he exemplifies the spirit of innovation in his field.

Collaborations

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Conclusion

Ichikawa Hiroyuki's contributions to contact probe technology reflect his dedication to innovation and improvement in electrical testing. His work continues to influence the industry positively.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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