This inventor holds 2 USPTO granted patents. Top assignee: Oxford Instruments Analytical Limited. Active years: 2006-2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2006-2012
Title: Ian Richard Barkshire: Innovator in Material Analysis
Introduction
Ian Richard Barkshire is a notable inventor based in Cambs, GB. He has made significant contributions to the field of material analysis, holding two patents that showcase his innovative approach to technology.
Latest Patents
Barkshire's latest patents include a method for quantitative analysis of a material and a sample inspection apparatus. The method for quantitative analysis involves an electron beam impinging upon a material, detecting low loss electrons (LLEs) and x-rays from overlapping regions of the material, and generating compositional data. The sample inspection apparatus features a sample support, a detection system for radiation emitted by the sample, and a cooling system that includes oscillating mechanical components.
Career Highlights
Ian Richard Barkshire works at Oxford Instruments Analytical Limited, where he applies his expertise in material analysis. His work has contributed to advancements in the field, particularly in the development of innovative inspection techniques.
Collaborations
Barkshire has collaborated with notable colleagues, including Peter John Statham and Santokh Singh Bhadare, enhancing the impact of his work through teamwork and shared expertise.
Conclusion
Ian Richard Barkshire's contributions to material analysis through his patents and work at Oxford Instruments Analytical Limited highlight his role as an influential inventor in the field. His innovative methods and collaborative efforts continue to advance technology in material inspection.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile