Oxon, United Kingdom

Ian Radley

This inventor holds 1 USPTO granted patent. Top assignee: Oxford Instruments Analytical Limited. Active years: 2003.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ian Radley. Retrieved from https://idiyas.com/inventor/ian-radley-c9uy0tmk

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2003

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1 patent (USPTO):Explore Patents

Title: Ian Radley: Innovator in Detection Systems

Introduction

Ian Radley is a notable inventor based in Oxon, GB. He has made significant contributions to the field of detection systems. With a focus on innovation, he has secured a patent that showcases his expertise and creativity.

Latest Patents

Ian Radley holds a patent for a detection system. This invention reflects his commitment to advancing technology and improving detection methodologies. His patent is a testament to his innovative spirit and technical knowledge. He has 1 patent to his name.

Career Highlights

Ian Radley is currently employed at Oxford Instruments Analytical Limited. His role at the company allows him to work on cutting-edge technologies and contribute to the development of advanced analytical instruments. His career is marked by a dedication to innovation and excellence in his field.

Collaborations

Ian has collaborated with talented individuals such as Santokh Singh Bhadare and Christopher Tyrrell. These collaborations have enriched his work and fostered a creative environment for innovation.

Conclusion

Ian Radley is a distinguished inventor whose work in detection systems has made a significant impact. His contributions to Oxford Instruments Analytical Limited and his collaborations with other professionals highlight his commitment to advancing technology. His achievements serve as an inspiration for future innovators in the field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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