Company Filing History:
Years Active: 1988-2013
Title: Ian M Woodhead: Innovator in Time Domain Reflectometry
Introduction
Ian M Woodhead is a notable inventor based in Christchurch, New Zealand. He has made significant contributions to the field of electromagnetic pulse measurement and dielectric constant monitoring. With a total of 3 patents, his work reflects a commitment to advancing technology in these areas.
Latest Patents
Ian's latest patents include a Time Domain Reflectometry system and a Dielectric Constant Monitor. The Time Domain Reflectometry system is a non-invasive method for measuring parameters of an electromagnetic Radio Frequency pulse transmitted along a transmission line. This system is designed to measure parameters such as amplitude, propagation velocity, and propagation time. It features a transmission line structure with three or more elongated transmission elements, each capable of being selectively activated to generate distinct electric field potentials.
The Dielectric Constant Monitor allows for the monitoring of the average dielectric constant in mediums like soil. This is achieved using an oscillator that incorporates a transmission line embedded in the medium. The transmission line serves as a feedback loop for an amplifier, enabling one-way propagation of an electrical signal. The oscillation frequency indicates the dielectric constant of the medium, which is influenced by factors such as moisture content.
Career Highlights
Throughout his career, Ian has worked with various organizations, including Lincoln College and Development Finance Corporation. His experience in these institutions has contributed to his expertise in the field of electromagnetic measurements and monitoring systems.
Collaborations
Ian has collaborated with notable individuals such as Stephen J Hirsch and Ian Gregory Platt. These collaborations have likely enriched his work and contributed to the development of his innovative patents.
Conclusion
Ian M Woodhead is a distinguished inventor whose work in Time Domain Reflectometry and dielectric constant monitoring showcases his innovative spirit. His contributions continue to impact the field and inspire future advancements in technology.
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