Minneapolis, MN, United States of America

Ian J De Silva


Average Co-Inventor Count = 3.0

ph-index = 1

Forward Citations = 7(Granted Patents)


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Inventor Ian J De Silva: Innovating Device Integrity Measurement

Introduction

Ian J De Silva is a notable inventor based in Minneapolis, MN, recognized for his innovative contributions in the field of computing apparatus integrity. With one patent to his name, he stands out in the landscape of technological advancements designed to enhance device reliability and security.

Latest Patents

Ian's patent, titled "Dynamically measuring the integrity of a computing apparatus," introduces novel methods and systems for evaluating the integrity of electronic devices. The patent showcases various embodiments, including the initiation of an observatory within a system and the employment of a remote manager. Through these mechanisms, the integrity of a device can be assessed effectively, facilitating a robust approach to managing computing apparatus reliability.

Career Highlights

Currently, Ian is employed at Adventium Enterprises, LLC, where he applies his expertise in innovation and technology. His contributions to the development of methods for measuring device integrity demonstrate his commitment to advancing computing technology and ensuring the reliability of electronic systems.

Collaborations

Throughout his career, Ian has collaborated with talented individuals such as Todd Peter Carpenter and Steven J Johnston. These partnerships reflect a dynamic working environment where innovative ideas are exchanged, further enhancing the capabilities within Adventium Enterprises.

Conclusion

Ian J De Silva is an influential figure in the field of technological innovation, particularly in the realm of computing device integrity. His patent and work at Adventium Enterprises underscore his dedication to advancing industry standards through innovative solutions. As technology continues to evolve, inventors like Ian play a crucial role in shaping the future of device integrity measurement.

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