HyunMin Bae

Title: HyunMin Bae: Innovator in Jitter Tolerance Testing

Introduction

HyunMin Bae is a notable inventor based in Daejeon, South Korea. He has made significant contributions to the field of electronic testing, particularly in the development of jitter tolerance testing technologies. His innovative approach has led to the creation of a unique patent that addresses critical challenges in this area.

Latest Patents

HyunMin Bae holds a patent for an "Internal Jitter Tolerance Tester with an Internal Jitter Generator." This invention includes a digital loop filter that consists of a cyclic accumulator, a gain multiplier, and an internal accumulated jitter generator. The internal jitter generator may utilize a pseudo-random binary sequence (PRBS) generator, a digital loop filter, and a gain controller. This technology is essential for accurately testing the tolerance of electronic systems to jitter, which is crucial for maintaining signal integrity.

Career Highlights

Throughout his career, HyunMin Bae has worked with prestigious organizations, including the Korea Advanced Institute of Science and Technology and Terasquare Co. Ltd. His experience in these institutions has allowed him to refine his skills and contribute to advancements in electronic testing methodologies.

Collaborations

HyunMin Bae has collaborated with talented individuals in his field, including Joon Yeong Lee and Jin Ho Park. These partnerships have fostered innovation and have been instrumental in the development of his patented technologies.

Conclusion

HyunMin Bae's contributions to jitter tolerance testing exemplify the impact of innovative thinking in technology. His patent and career achievements highlight his dedication to advancing electronic testing solutions.