Hwaseong, South Korea

Hyungsuk Cho

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2019.

USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 6.0

ph-index = 1


Company Filing History:


Years Active: 2019

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Hyungsuk Cho: Innovator in Substrate Inspection Technology

Introduction

Hyungsuk Cho is a notable inventor based in Hwaseong, South Korea. He has made significant contributions to the field of semiconductor device fabrication through his innovative patent. His work focuses on improving the efficiency and accuracy of substrate inspection systems.

Latest Patents

Hyungsuk Cho holds a patent titled "System and method of inspecting substrate and method of fabricating semiconductor device using the same." This patent describes a substrate inspection system that includes a substrate support, optics for irradiating a patterned structure on the substrate, and an image processor for defect detection. The system is designed to adjust the focal position of incident light to enhance the detection of defects in the patterned structure, which may include patterns with varying heights.

Career Highlights

Hyungsuk Cho is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His work at Samsung has allowed him to be at the forefront of semiconductor technology, contributing to advancements that are crucial for modern electronics.

Collaborations

Hyungsuk Cho has collaborated with talented coworkers, including Yusin Yang and Dongchul Ihm. Their combined expertise has fostered an environment of innovation and creativity within their projects.

Conclusion

Hyungsuk Cho's contributions to substrate inspection technology exemplify the importance of innovation in the semiconductor industry. His patent reflects a commitment to enhancing the quality and efficiency of semiconductor devices.

Profile summary based on public USPTO records.
Please report any incorrect information to [email protected]
Loading…