Suwon, South Korea

Hyung Jin Ham

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2020.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyung Jin Ham. Retrieved from https://idiyas.com/inventor/hyung-jin-ham

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2020

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1 patent (USPTO):Explore Patents

Title: Hyung Jin Ham - Innovator in X-ray Detection Technology

Introduction

Hyung Jin Ham is a notable inventor based in Suwon-si, South Korea. He has made significant contributions to the field of x-ray detection technology. His innovative work has led to the development of a unique x-ray detecting apparatus.

Latest Patents

Hyung Jin Ham holds a patent for an x-ray detecting apparatus. This apparatus features a housing that contains a detecting panel designed to detect x-rays. Additionally, it includes a circuit board with a first surface bordering the detecting panel and a second surface equipped with at least one electronic component.

Career Highlights

Hyung Jin Ham is currently employed at Samsung Electronics Co., Ltd., a leading technology company known for its advancements in electronics and innovation. His work at Samsung has allowed him to focus on developing cutting-edge technologies that enhance x-ray detection capabilities.

Collaborations

Throughout his career, Hyung Jin Ham has collaborated with talented individuals such as Young Ik Kim and Jin Woo Park. These collaborations have contributed to the successful development of innovative technologies in the field.

Conclusion

Hyung Jin Ham's contributions to x-ray detection technology exemplify his dedication to innovation and excellence. His patent and work at Samsung Electronics Co., Ltd. highlight his role as a key player in advancing this important field.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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