Seoul, South Korea

Hyundong Shin

This inventor holds 1 USPTO granted patent. Top assignee: Gm Global Technolgoy Operations, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyundong Shin. Retrieved from https://idiyas.com/inventor/hyundong-shin-2dbsqv0q

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hyundong Shin: Inventor of an Automatic Vehicle Access-Door Control

Introduction

Hyundong Shin is an inventor based in Seoul, South Korea. His patent work includes a vehicle access-door control method designed to help prevent a door from contacting nearby obstacles.

Latest Patents

Shin is associated with 1 patent, titled “Automatic Control of Vehicle Access Door.” The invention describes a method in which an electronic controller receives a command to open a vehicle access door and detects an obstacle within the door’s operating range. A camera projects a predefined image onto the obstacle, and the controller processes the image’s pixelated resolution to estimate the obstacle’s distance and position relative to the door’s range of motion. When the obstacle is within a predetermined zone, the controller limits the door’s operation to help avoid physical contact.

Career Highlights

Shin is associated with GM Global Technology Operations, Inc. His patent focuses on using camera-based sensing and electronic control to manage vehicle-door movement around nearby obstacles.

Collaborations

The provided information identifies Hyoungsuk Kim and Rakyung Gwak as Shin’s coworkers. Their specific roles in the patent or related work are not specified.

Conclusion

Hyundong Shin’s patent describes a vehicle access-door control approach that uses image processing and electronic control to detect obstacles and limit door movement, helping reduce the risk of contact.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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