Seoul, South Korea

Hyundo Lee

This inventor holds 1 USPTO granted patent. Top assignee: Seoul National University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyundo Lee. Retrieved from https://idiyas.com/inventor/hyundo-lee-vdraz5sz

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hyundo Lee and Sketch-Based Geometric Representation Learning.

Introduction

Hyundo Lee is an inventor based in Seoul, South Korea, associated with Seoul National University. His patent work includes a method and apparatus for converting images into sketches for geometrical representation learning.

Latest Patents

Lee is credited with 1 patent: “Method and Apparatus for Conversion into Sketches for Geometrical Representation Learning.” The invention describes a system that receives initial stroke information with attribute parameters and image information about a target image. Using a stroke generation model, the system converts the image into multiple final strokes that represent its geometry, then outputs the processed stroke data. The apparatus includes an input/output interface, storage for the program, and a controller with at least one processor.

Career Highlights

Lee’s listed patent highlights an approach to representing images through generated sketches and geometric information. The disclosed apparatus and method are designed to process a target image and produce a set of strokes that capture its geometric features.

Collaborations

Lee is associated with Seoul National University. His listed coworkers include Byoung-Tak Zhang and Inwoo Hwang.

Conclusion

Hyundo Lee’s patent focuses on converting images into geometrically informative sketches, connecting image processing with representation learning.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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