Hyun Yoe

Title: Hyun Yoe and Smart-Farm Crop Phenotyping

Introduction

Hyun Yoe is an inventor based in Seoul, South Korea. His work includes a patented approach to analyzing crop growth and plant phenotypes using multiple types of images. He is associated with the Industry-Academic Cooperation Foundation of Sunchon National University.

Latest Patents

Yoe is named on one patent, titled “Apparatus for Analyzing Crop Growth Information Through Multiple Composite Images and Method for Exploring Plant Phenotypes Using the Same.” The invention uses RGB, thermal-imaging, and hyperspectral cameras to capture crop images. It analyzes the images and their composites to distinguish crop phenotypes and assess characteristics such as vegetation indices and water stress. This information can help growers select and cultivate crop varieties suited to the local region, climate, and terrain, with the aim of improving smart-farm productivity.

Career Highlights

Yoe’s patent reflects an application of imaging and data analysis to agricultural decision-making. By combining visible-light, thermal, and hyperspectral information, the disclosed technique is designed to help identify differences in crop traits and environmental resistance.

Collaborations

The patent lists Gwang Hoon Jung and Meong Hun Lee as Yoe’s coworkers. The work is associated with the Industry-Academic Cooperation Foundation of Sunchon National University.

Conclusion

Hyun Yoe’s patented work brings together multiple imaging technologies to support crop phenotyping and informed cultivation choices in smart farms.