Yongin, South Korea

Hyoung Wook Kim

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Display Co., Ltd.. Active years: 2022.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyoung Wook Kim. Retrieved from https://idiyas.com/inventor/hyoung-wook-kim-m160gnsn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 5.0

ph-index = 1


Company Filing History:


Years Active: 2022

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1 patent (USPTO):Explore Patents

Title: Hyoung Wook Kim: Innovator in Display Technology

Introduction

Hyoung Wook Kim is a notable inventor based in Yongin-si, South Korea. He has made significant contributions to the field of display technology, particularly through his innovative patent.

Latest Patents

Hyoung Wook Kim holds a patent for a display device and its driving method. This invention includes a display panel with pixels, a scan driver that supplies scan signals to scan lines, and a data driver that provides data signals corresponding to image data. Additionally, it features a sensing part that senses the threshold voltage of a first transistor in each pixel and corrects it based on voltage drops from internal resistances. The timing controller generates image data by adjusting input image data according to the corrected threshold voltage.

Career Highlights

Hyoung Wook Kim is currently employed at Samsung Display Co., Ltd., where he continues to advance display technology. His work has been instrumental in enhancing the performance and efficiency of display devices.

Collaborations

Some of his coworkers include Yong Jin Shin and Kyun Ho Kim, who contribute to the innovative environment at Samsung Display Co., Ltd.

Conclusion

Hyoung Wook Kim's contributions to display technology through his patent demonstrate his expertise and commitment to innovation in the field. His work continues to influence the development of advanced display devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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