Stuttgart, Germany

Hyosang Lee

This inventor holds 1 USPTO granted patent and 2 published patent applications. Top assignee: Max-Planck-Gesellschaft Zur Förderung Der Wissenschaften E. V. . Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyosang Lee. Retrieved from https://idiyas.com/inventor/hyosang-lee-jsbki5eo

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hyosang Lee and Force-Inference Innovation

Introduction

Hyosang Lee is an inventor associated with Stuttgart, Germany, and the Max Planck Society for the Advancement of Science (Max-Planck-Gesellschaft zur Förderung der Wissenschaften e. V.). His listed patent concerns using neural networks to infer forces from sensor pressure readings.

Latest Patents

Lee is credited with 1 patent: “Method for Force Inference of a Sensor Arrangement, Methods for Training Networks, Force Inference Module and Sensor Arrangement.” The disclosure describes reading pressure values from a sensor arrangement and calculating a force map with a feed-forward neural network. It also addresses methods for training neural networks, a force-inference module, and a sensor arrangement.

Career Highlights

The available information connects Lee’s inventive work with the Max Planck Society and research into sensor-based force inference. The patent’s approach applies machine learning to translate pressure measurements into a map of forces.

Collaborations

Lee’s listed coworkers include Adam Spiers and Georg Martius. Their names provide context for the research environment associated with his work.

Conclusion

Hyosang Lee’s patent documents an application of neural networks to force sensing, linking sensor measurements with computational force inference.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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