Asan, South Korea

Hyeong-Gon Son

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Co., Ltd.. Active years: 2021.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyeong-Gon Son. Retrieved from https://idiyas.com/inventor/hyeong-gon-son

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2021

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1 patent (USPTO):Explore Patents

Title: Hyeong-Gon Son: Innovator in Semiconductor Testing

Introduction

Hyeong-Gon Son is a notable inventor based in Asan-si, South Korea. He has made significant contributions to the field of semiconductor technology. His innovative work has led to the development of a unique testing method that enhances the efficiency of semiconductor devices.

Latest Patents

Hyeong-Gon Son holds a patent for a "Test method for semiconductor devices and a test system for semiconductor devices." This patent outlines a comprehensive testing method that includes loading a test tray with semiconductor devices, storing lot information, performing a test program, obtaining ID information, and sorting the devices based on test results. This method aims to improve the accuracy and reliability of semiconductor testing.

Career Highlights

Hyeong-Gon Son is currently employed at Samsung Electronics Co., Ltd., a leading company in the technology sector. His role involves working on advanced semiconductor technologies, contributing to the company's reputation for innovation and quality.

Collaborations

He collaborates with talented coworkers, including Chul-Min Lee and Tae-Kyung Ko. Their combined expertise fosters a creative environment that drives technological advancements in semiconductor testing.

Conclusion

Hyeong-Gon Son's contributions to semiconductor testing exemplify the importance of innovation in technology. His patent and work at Samsung Electronics Co., Ltd. highlight his commitment to enhancing the efficiency and reliability of semiconductor devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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