This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Electronics Ltd.. Active years: 2026.
Company Filing History:
Years Active: 2026
Title: HyeonBo Shim: Innovator in Substrate Inspection Technology
Introduction
HyeonBo Shim is a notable inventor based in Suwon, South Korea. He has made significant contributions to the field of substrate inspection technology. His innovative work has led to the development of a unique patent that enhances the efficiency of substrate inspection processes.
Latest Patents
HyeonBo Shim holds a patent for a "Substrate inspection apparatus and method of inspecting a substrate using the same." This apparatus includes a laser light source that emits a laser beam, an optical splitter that divides the beam into two, and a delay stage that adjusts the relative time delay of the second laser beam. Additionally, it features a first modulator that alters the first laser beam and a feedback system that senses the reflected second laser beam from a substrate, applying electrical feedback to the first modulator. This innovative design aims to improve the accuracy and reliability of substrate inspections.
Career Highlights
HyeonBo Shim is currently employed at Samsung Electronics Ltd., a leading global technology company. His role at Samsung has allowed him to work on cutting-edge technologies and contribute to advancements in the electronics industry. His expertise in substrate inspection has positioned him as a valuable asset to his team.
Collaborations
HyeonBo Shim collaborates with Jaewon Yang, who is also involved in the development of innovative technologies at Samsung. Their partnership has fostered a creative environment that encourages the exploration of new ideas and solutions in substrate inspection.
Conclusion
HyeonBo Shim's contributions to substrate inspection technology through his patent and work at Samsung Electronics Ltd. highlight his role as an influential inventor in the field. His innovative approaches continue to shape the future of substrate inspection processes.