Seoul, South Korea

Hyeon-Jin Ahn

This inventor holds 1 USPTO granted patent. Top assignees: Samsung Electronics Co., Ltd., Sogang University Research Foundation. Active years: 2018.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyeon-Jin Ahn. Retrieved from https://idiyas.com/inventor/hyeon-jin-ahn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2018

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1 patent (USPTO):Explore Patents

Title: Hyeon-Jin Ahn: Innovator in Image Processing Technology

Introduction

Hyeon-Jin Ahn is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of image processing, particularly in developing technologies that enhance image clarity.

Latest Patents

Hyeon-Jin Ahn holds a patent for an "Image haze removing apparatus and method of removing image haze." This innovative apparatus includes several components such as a transmission coefficient generator, a low pass filter, a particle size parameter estimator, a transmission coefficient divider, and a real image estimator. The apparatus works by generating a transmission coefficient based on a captured image and applying various filters and estimators to enhance the image quality.

Career Highlights

Throughout his career, Hyeon-Jin Ahn has worked with prominent organizations, including Samsung Electronics and the Sogang University Research Foundation. His experience in these institutions has allowed him to refine his skills and contribute to cutting-edge research in image processing.

Collaborations

Hyeon-Jin Ahn has collaborated with notable colleagues such as Rae-Hong Park and Dong-Won Jang. These partnerships have fostered innovation and development in their respective fields.

Conclusion

Hyeon-Jin Ahn's work in image processing technology exemplifies the impact of innovative thinking in enhancing visual clarity. His contributions continue to influence advancements in this important area of technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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