Suwon, South Korea

Hyemun Lee

This inventor holds 1 USPTO granted patent. Top assignee: Samsung Electronics Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyemun Lee. Retrieved from https://idiyas.com/inventor/hyemun-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

Loading Chart...
1 patent (USPTO):Explore Patents

Title: Hyemun Lee and Semiconductor Clock-Skew Calibration

Introduction

Hyemun Lee is an inventor based in Suwon, South Korea, whose patent work concerns semiconductor devices and clock-signal calibration. His listed patent describes a method for detecting and correcting skew between a track signal and internal clock signals.

Latest Patents

Lee is associated with 1 patent: “Semiconductor Package Calibrating Skew of Clock Signal, Semiconductor Device, and Operating Method of the Semiconductor Device.” The invention describes a receiver that samples data and track signals in response to rising edges of internal clock-signal pairs. A controller assesses skew by counting how often a specified logic level of the track signal is sampled in synchronization with each clock pair. Based on the detected skew status, the controller provides a clock-shift signal to the receiver to calibrate the clock skew.

Career Highlights

Lee is associated with Samsung Electronics Ltd. His listed invention focuses on signal timing calibration in semiconductor devices, addressing the alignment of track and clock signals.

Collaborations

The provided information lists TagGun Lee and Bharath Kumar N. as Lee’s coworkers. It does not specify their roles in the patent or whether they collaborated on this invention.

Conclusion

Hyemun Lee’s listed patent reflects work on improving clock-signal alignment through skew detection and calibration in semiconductor devices.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…