Yongin, South Korea

Hyelim Lee

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Samsung Display Co., Ltd.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyelim Lee. Retrieved from https://idiyas.com/inventor/hyelim-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

Average Co-Inventor Count = 10.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hyelim Lee and Display Gamma Voltage Correction

Introduction

Hyelim Lee is an inventor based in Yongin, South Korea. Her patent work concerns gamma voltage correction for display devices, with a method designed to account for measured light characteristics across different display areas.

Latest Patents

Lee is associated with 1 patent: “Gamma Voltage Correction Device and Gamma Voltage Correction Method for Display Device.” The method corrects gamma voltage for each sub-pixel in a first display area using measured light characteristics from that area across multiple gray levels. For a second display area, it uses measurements from both the second area and a surrounding area of the first display area, also across multiple gray levels.

Career Highlights

Lee is associated with Samsung Display Co., Ltd. Her patent reflects work on display calibration and on adapting gamma voltage correction to measured optical characteristics in different regions of a display.

Collaborations

The supplied information lists Younguk Hwang and Yoongyu Lee as Lee’s coworkers. Their names are also associated with the patent work described here.

Conclusion

Hyelim Lee’s patent focuses on region-specific gamma voltage correction, using measured light characteristics to support display performance across multiple gray levels.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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