Ushiku, Japan

Hyejeoung Lee

This inventor holds 1 USPTO granted patent. Top assignee: Hitachi Construction Machinery Co., Ltd.. Active years: 2025.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyejeoung Lee. Retrieved from https://idiyas.com/inventor/hyejeoung-lee-3mnbd6pw

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 4.0

ph-index = 1


Company Filing History:


Years Active: 2025

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1 patent (USPTO):Explore Patents

Title: Hyejeoung Lee: Advancing Satellite Positioning for Work Machines.

Introduction

Hyejeoung Lee is an inventor based in Ushiku, Japan, associated with Hitachi Construction Machinery Co., Ltd. His patent work includes a system designed to improve satellite-based positioning for construction machinery.

Latest Patents

Lee is named on one patent, titled “Work machine.” The invention describes a controller that stores multiple satellite mask ranges, selected according to the postures of a machine’s work device and swing structure. It evaluates positioning precision using satellite data from selections made with each mask range and from an unfiltered selection. The receiver then uses signals from the satellite selection associated with the highest calculated positioning precision to determine the antenna’s position. This approach is intended to support more reliable positioning as the machine’s configuration changes.

Career Highlights

Lee’s listed patent activity reflects work on positioning technology for construction equipment. His patent record includes 1 patent.

Collaborations

Lee’s patent is associated with Hitachi Construction Machinery Co., Ltd. His listed coworkers include Shinichi Kotake and Shiho Izumi.

Conclusion

Hyejeoung Lee’s patent focuses on adapting satellite selection to a work machine’s posture, helping its receiver choose positioning data based on calculated precision.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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