Saarlouis, Germany

Hyeck Hee Lee

This inventor holds 1 USPTO granted patent and 3 published patent applications, plus 2 CIPO patents and 3 EPO patents. Top assignee: F. Holzer Gmbh. Active years: 2016.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyeck Hee Lee. Retrieved from https://idiyas.com/inventor/hyeck-hee-lee-s6579yoa

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 1 

% Patents Active = 100.0

 

 

Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2016

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1 patent (USPTO):Explore Patents

Title: Innovations of Hyeck Hee Lee

Introduction

Hyeck Hee Lee is a notable inventor based in Ingbert, Germany. He has made significant contributions to the field of fluid dispensing technology. His innovative approach has led to the development of a unique metering device that enhances the precision of fluid measurement.

Latest Patents

Hyeck Hee Lee holds one patent for a metering device. This invention relates to a metering device for metered dispensing of a fluid. The design features a storage container connected to a metering head, with a spindle guided in the metering head that includes a through-channel for transporting the fluid.

Career Highlights

Hyeck Hee Lee is currently employed at F. Holzer GmbH, where he continues to work on advancements in metering technology. His expertise in this area has positioned him as a valuable asset to his company.

Collaborations

Hyeck Hee Lee collaborates with colleagues such as Frank Holzer and Ute Steinfeld, who contribute to the innovative environment at F. Holzer GmbH.

Conclusion

Hyeck Hee Lee's contributions to the field of fluid dispensing through his metering device patent exemplify his commitment to innovation. His work continues to influence the industry and improve the accuracy of fluid measurement.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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