Seoul, South Korea

Hye Kang Park

This inventor holds 1 USPTO granted patent and 1 published patent application. Top assignee: Yonsei University. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hye Kang Park. Retrieved from https://idiyas.com/inventor/hye-kang-park

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 1 

Average Co-Inventor Count = 1.0

ph-index = 1


Company Filing History:


Years Active: 2026

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1 patent (USPTO):Explore Patents

Title: Hye Kang Park and Confidence Calibration Innovation.

Introduction

Hye Kang Park is an inventor based in Seoul, South Korea, associated with Yonsei University. Her patent work addresses confidence calibration in image classification, with a focus on adapting label smoothing to the difficulty of classification tasks.

Latest Patents

Park is associated with 1 patent, titled “Apparatus and Method for Confidence Calibration Based on Adaptive Label Smoothing.” The invention describes a computing-device method that inputs image data into an image classification model and obtains the model’s logits and prediction probabilities. It then produces a label-smoothing loss function using learnable margin parameters, label-smoothing weights based on image-classification difficulty, or both.

Career Highlights

Park’s patent highlights an approach to calibrating model confidence by adapting label smoothing to the classification context. The disclosed method connects image difficulty with the loss function used during model training.

Collaborations

The patent information names Bum Sub Ham and Jong Youn Noh as Park’s coworkers. Her listed institutional affiliation is Yonsei University.

Conclusion

Hye Kang Park’s patent presents an adaptive label-smoothing method for confidence calibration in image classification, reflecting her work associated with Yonsei University.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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