Seoul, South Korea

Hyang Tag Lim

This inventor holds 1 USPTO granted patent. Top assignee: Korea Institute of Science and Technology. Active years: 2023.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hyang Tag Lim. Retrieved from https://idiyas.com/inventor/hyang-tag-lim

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank

% Patents Active = 100.0

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2023

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1 patent (USPTO):Explore Patents

Title: Innovations of Hyang Tag Lim

Introduction

Hyang Tag Lim is a notable inventor based in Seoul, South Korea. He has made significant contributions to the field of optical devices through his innovative research and development.

Latest Patents

Hyang Tag Lim holds a patent for an "Inverted nanocone structure for optical device and method of producing the same." This patent describes an inverted nanocone structure that includes a first surface, a second surface spaced apart from the first surface by a predetermined distance and having a greater area than the first surface, and a body having an inverted cone shape between the first surface and the second surface. Additionally, at least one activated point defect center is provided in the body. He has 1 patent to his name.

Career Highlights

Hyang Tag Lim is affiliated with the Korea Institute of Science and Technology, where he conducts his research. His work focuses on advancing optical technologies and enhancing device performance.

Collaborations

He has collaborated with notable colleagues, including Sang Wook Han and Seung Woo Jeon, contributing to various research projects and innovations in the field.

Conclusion

Hyang Tag Lim's contributions to optical device technology through his innovative patent and collaborative efforts highlight his role as a significant inventor in the field. His work continues to influence advancements in optical applications.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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