Hwan Bin Kim

Title: Hwan Bin Kim: Innovator in Substrate Type Sensors

Introduction

Hwan Bin Kim is a notable inventor based in Chungcheongnam-do, South Korea. He has made significant contributions to the field of sensor technology, particularly in the development of substrate type sensors. His innovative work focuses on measuring the horizontality of substrate support members in environments with temperature variations.

Latest Patents

Hwan Bin Kim holds a patent for a "Substrate type sensor for measuring horizontality of substrate support member provided in atmosphere accompanied by temperature change, method for measuring horizontality of substrate support member by using the same, and non-transitory computer readable medium." This patent describes a substrate type sensor designed to operate in atmospheres with temperature changes, enabling accurate measurement of the horizontality of support members that hold substrates. The sensor includes a base shaped like the substrate, multiple sensors such as three or more axis acceleration sensors or six or more axis measurement units (IMUs), a receiver for data collection, and a power source to supply electricity to the sensors and receiver.

Career Highlights

Hwan Bin Kim is currently employed at Semes Co., Ltd., where he continues to advance his research and development in sensor technology. His work has been instrumental in enhancing the precision and reliability of substrate measurements in various applications.

Collaborations

Hwan Bin Kim collaborates with talented colleagues, including Young Seop Choi and Yong-Jun Seo. Their combined expertise contributes to the innovative projects at Semes Co., Ltd.

Conclusion

Hwan Bin Kim's contributions to substrate type sensors exemplify his commitment to innovation in sensor technology. His patent and ongoing work at Semes Co., Ltd. highlight his role as a key figure in advancing measurement techniques in challenging environments.