This inventor holds 1 USPTO granted patent. Top assignee: Chinese Academy of Sciences. Active years: 2025.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2025
Title: Huyue Zhan: Innovator in Geological Disaster Characterization
Introduction
Huyue Zhan is a notable inventor based in Diqing, China. He has made significant contributions to the field of geological disaster management through his innovative methods and devices. His work focuses on quantitatively characterizing the development positions of geological disasters in slopes.
Latest Patents
Huyue Zhan holds a patent for a "Method and device for quantitatively characterizing development positions of geological disasters in slopes, and electronic device." This invention provides a comprehensive method that includes acquiring a slope boundary of a target slope and constructing a triangle that matches the slope boundary. The method involves acquiring slope terrain points within the range of the triangle and assigning preset attribute information to each slope terrain point. The attributes include angle and distance ratio information, which are essential for screening out disaster points and displaying them in a polar coordinate system.
Career Highlights
Huyue Zhan is affiliated with the Chinese Academy of Sciences, where he conducts research and development in geological disaster management. His innovative approach has garnered attention in the scientific community, contributing to advancements in the field.
Collaborations
Huyue Zhan collaborates with esteemed colleagues such as Yongchao Li and Shishu Zhang. Their combined expertise enhances the research and development efforts at the Chinese Academy of Sciences.
Conclusion
Huyue Zhan's contributions to the characterization of geological disasters demonstrate his commitment to innovation and research. His patent reflects a significant advancement in understanding and managing geological risks.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
