Huwei Tan

Title: Huwei Tan: Innovator in Intravascular Analysis Technology

Introduction

Huwei Tan is a notable inventor based in Needham, MA (US), recognized for his contributions to intravascular analysis technology. With a total of three patents to his name, Tan has made significant strides in enhancing the accuracy and effectiveness of medical analysis modalities.

Latest Patents

Tan's latest patents focus on a system and method for intravascular structural analysis compensation of chemical analysis modality. This multimodal intravascular analysis employs a structural analysis modality to enhance the accuracy of a chemical analysis modality. Examples of structural analysis include intravascular ultrasound (IVUS) and optical coherence tomography (OCT), along with techniques such as optical coherence domain reflectometry (OCDR) and optical frequency domain imaging (OFDI). The chemical or functional analysis methods include optical, near-infrared (NIR), Raman, fluorescence spectroscopy, thermography, and reflectometry. In one application, the structural analysis characterizes the environment, such as the distance between the catheter head and the vessel wall. This information is crucial for selecting from multiple depth-specific algorithms, thereby improving the accuracy of the chemical or functional analysis.

Career Highlights

Huwei Tan is currently employed at Infraredx, Inc., where he continues to innovate in the field of intravascular analysis. His work has significantly impacted the medical technology landscape, particularly in enhancing diagnostic capabilities.

Collaborations

Tan collaborates with esteemed colleagues such as Jay D Caplan and Barbara Marshik-Geurts, contributing to a dynamic and innovative work environment.

Conclusion

Huwei Tan's contributions to intravascular analysis technology exemplify the importance of innovation in medical diagnostics. His patents and ongoing work at Infraredx, Inc. highlight his commitment to improving healthcare outcomes through advanced technology.