Larkspur, CA, United States of America

Hussein Al-Hussein

This inventor holds 2 USPTO granted patents. Top assignee: Veritec, Inc.. Active years: 2012-2014.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Hussein Al-Hussein. Retrieved from https://idiyas.com/inventor/hussein-al-hussein-vdel9km3

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.0

ph-index = 1

Forward Citations = 6(Granted Patents)


Company Filing History:


Years Active: 2012-2014

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2 patents (USPTO):Explore Patents

Title: Innovations of Hussein Al-Hussein

Introduction

Hussein Al-Hussein is a notable inventor based in Larkspur, California. He has made significant contributions to the field of identification symbols and reading systems. With a total of 2 patents, his work showcases innovative approaches to technology.

Latest Patents

Hussein's latest patents include a two-dimensional symbol and method for reading the same. This invention discloses an identification symbol and system that features a two-dimensional, rectangular or square bar code symbol. It is designed with a solid border and a tick-mark region adjacent to the solid border. The system boasts omni-directional reading capabilities along with error detection and correction features.

Career Highlights

Hussein Al-Hussein is currently associated with Veritec, Inc., where he applies his expertise in developing advanced identification systems. His work has been instrumental in enhancing the efficiency and accuracy of reading symbols in various applications.

Collaborations

Hussein collaborates with Michael A Christian, contributing to innovative projects and advancements in their field.

Conclusion

Hussein Al-Hussein's contributions to the field of identification symbols and reading systems highlight his innovative spirit and dedication to technology. His patents reflect a commitment to improving the way we interact with identification systems.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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