Hung Van Pham

Title: Innovations by Inventor Hung Van Pham

Introduction

Hung Van Pham is a notable inventor based in Santa Clara County, California. He has made significant contributions to the field of semiconductor technology, particularly in the measurement of thin films. His innovative approach has led to the development of a unique system that enhances the accuracy of film thickness measurements.

Latest Patents

Hung Van Pham holds a patent for a "High accuracy film thickness measurement system." This system is designed to ascertain the thickness of thin films, especially on semiconductor substrates. It comprises a light source, a randomized bifurcated fiber optic bundle, a pentamirror, a rapid scanning monochromator with a rotating grating, a photodetector, and an A/D converter. The system effectively directs light to and receives reflected light from the surface of the thin film. The reflected light passes through the bifurcated bundle to the monochromator and to the photodetector, whose output is read by the A/D converter. A timing control circuit ensures that the A/D converter consistently samples the analog signal representative of the same portions of the reflected visible spectra returned from the thin film under test.

Career Highlights

Hung Van Pham is currently employed at Prometrix Corporation, where he continues to innovate in the field of semiconductor technology. His work has been instrumental in advancing measurement techniques that are critical for the development of modern electronic devices.

Collaborations

Some of his notable coworkers include Wayne K Borglum and Chester L Mallory. Their collaborative efforts contribute to the innovative environment at Prometrix Corporation.

Conclusion

Hung Van Pham's contributions to the field of semiconductor technology through his patented innovations demonstrate his expertise and commitment to advancing measurement techniques. His work continues to impact the industry positively.