Company Filing History:
Years Active: 2025
Title: Innovations of Hung-Chuan Mai in Multilayer Film Measurement
Introduction
Hung-Chuan Mai is a notable inventor based in Miaoli County, Taiwan. He has made significant contributions to the field of measurement technology, particularly in multilayer film applications. His innovative approach has led to the development of a unique measuring device that enhances accuracy in multilayer film assessments.
Latest Patents
Hung-Chuan Mai holds a patent for a "Multilayer film measuring device and multilayer film measuring method." This device comprises a measuring module, a multilayer film to be measured, and a circular polarization module. The measuring module generates a laser beam that passes through the circular polarization module to the multilayer film. A reflective polarizer within the multilayer film reflects the laser beam back through the circular polarization module to a receiving module. This process allows for precise measurement of the multilayer film, as the laser beam's shift is absorbed by a second linear polarizer, ensuring accurate results. He has 1 patent to his name.
Career Highlights
Throughout his career, Hung-Chuan Mai has worked with various companies that specialize in optoelectronics and measurement technologies. Notably, he has been associated with Interface Technology (Chengdu) Co., Ltd. and Interface Optoelectronics (Shenzhen) Co., Ltd. His experience in these organizations has contributed to his expertise in developing advanced measurement devices.
Collaborations
Hung-Chuan Mai has collaborated with several professionals in his field, including Ling-kuei Hung and Jiang-Yun Zhou. These collaborations have likely enriched his work and led to further innovations in multilayer film measurement technologies.
Conclusion
Hung-Chuan Mai's contributions to multilayer film measurement technology demonstrate his innovative spirit and dedication to precision in measurement. His patent reflects a significant advancement in the field, showcasing his expertise and commitment to enhancing measurement accuracy.