The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 07, 2025
Filed:
May. 16, 2023
Interface Technology (Chengdu) Co., Ltd., Sichuan, CN;
Interface Optoelectronics (Shenzhen) Co., Ltd., Guangdong, CN;
General Interface Solution Limited, Miaoli County, TW;
Ling-Kuei Hung, Miaoli County, TW;
Jiang-Yun Zhou, Miaoli County, TW;
Hung-Chuan Mai, Miaoli County, TW;
Sheng-Chun Chuang, Miaoli County, TW;
Interface Technology (ChengDu) Co., Ltd., Chengdu, CN;
Interface Optoelectronics (ShenZhen) Co., Ltd., Shenzhen, CN;
General Interface Solution Limited, Miaoli County, TW;
Abstract
A multilayer film measuring device, which comprises in sequence: a measuring module, a multilayer film to be measured, and a circular polarization module. When the measuring module can generate a laser beam through the circular polarization module to the multilayer film to be measured, a reflective polarizer of the multilayer film to be measured completely reflects the laser beam through the circular polarization module to the receiving module, and the laser beam shifted by a surface of a first waveplate of the multilayer film to be measured is absorbed by a second linear polarizer of the circular polarization module, so that the multilayer film can be measured accurately.