This inventor holds 1 USPTO granted patent. Top assignee: Zhejiang University. Active years: 2019.
Company Filing History:
Years Active: 2019
Title: Huiting Chai: Innovator in Optical Component Evaluation
Introduction
Huiting Chai is a notable inventor based in Zhejiang, China. He has made significant contributions to the field of optical components, particularly in the evaluation of surface defects. His innovative approach enhances the efficiency and precision of inspections in this specialized area.
Latest Patents
Huiting Chai holds a patent for a "Surface defects evaluation system and method for spherical optical components." This invention provides a comprehensive system for evaluating surface defects using microscopic scattering dark-field imaging. The method involves sub-aperture scanning of spherical optical components, allowing for the acquisition of detailed surface defect information through advanced image processing techniques. The invention effectively utilizes the scattering light generated by surface defects when illuminated with an annular beam. It incorporates a series of procedures, including global correction of sub-apertures, 3D stitching, 2D projection, and digital feature extraction, to inspect and evaluate defects quantitatively. This innovation significantly improves the inspection process by providing a reliable numerical basis for the use and processing of spherical optical components.
Career Highlights
Huiting Chai is affiliated with Zhejiang University, where he continues to advance research in optical technologies. His work has garnered attention for its practical applications and contributions to the field.
Collaborations
Huiting Chai has collaborated with notable colleagues, including Yongying Yang and Dong Liu, to further enhance research and development in optical component evaluation.
Conclusion
Huiting Chai's innovative work in the evaluation of spherical optical components represents a significant advancement in the field. His patented methods provide a reliable and efficient approach to surface defect inspection, contributing to the overall quality and performance of optical technologies.